Skip to search boxSkip to navigationSkip to main content

The effect of measurement parameters on cellular mechanics detection

  • Rui Wang
    ,
  • Fan Yang
    ,
  • Zuobin Wang
    ,
  • Dayou Li
Research Output:
Chapter in Book/Report/Conference proceeding
Conference contribution
 Peer-review

Abstract

Atomic force microscopy (AFM) is an advanced nanotechnology that can image and measure the mechanical properties of living cells in liquid environment. However, the measurement parameters will affect the mechanics data. In this work, the effects of indentation force, indentation speed, lifting height, and probe shape on the cellular mechanics detection were studied. The results showed that the indentation depth increased alongside the indentation force, while the baseline separation distance also showed an increase corresponding to the higher indentation speed, and the lifting height and cantilever shape had a significant effect on the force curves measurements. This is important for studying the measurement of cellular mechanical properties at the nanoscale.

Publication Information

Output type

Research Output:
Chapter in Book/Report/Conference proceeding
Conference contribution
 Peer-review

Original language

English

Pages from-to (Number of pages)

Pages 587-591 (5 pages)

Publication milestones

  • Published - 03/12/2024

Publication status

Published - 03/12/2024

Publisher

Institute of Electrical and Electronics Engineers Inc., United States

Publication series

  • Publication series name: 2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2024

ISBN (Print)

9798350362107

ISBN (Electronic)

9798350362107

Publication IDs

  • handle.net: 10547/626860
  • Scopus: 85214431894

Host publication title

2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2024

Host publication editors

  • Ying Wang
  • Yuxiao Cui
  • Jingran Zhang
  • Miao Yu
  • Hao Wu
  • Zuobin Wang

Access to documents