Exploration and analysis of fade depth scaling
- Vit Sipal,
- Ben Allen,
- David J. Edwards
- University of Oxford,
Research Output:
Chapter in Book/Report/Conference proceeding
Conference contribution
Peer-reviewAbstract
Publication Information
Output type
Research Output:
Chapter in Book/Report/Conference proceeding
Conference contribution
Peer-reviewOriginal language
EnglishPublication milestones
- Published - 13/12/2010
Publication status
Published - 13/12/2010
Publisher
Institute of Electrical and Electronics Engineers Inc., United StatesISBN (Print)
9781424473045Publication IDs
- handle.net: 10547/270917
- Scopus: 78651453552
