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Differential magnetic force microscope imaging

  • Ying Wang
    ,
  • Zuobin Wang
    ,
  • Jinyun Liu
    ,
  • Liwei Hou
  • Changchun University of Science and Technology
Research Output: Contribution to journal Article Peer-review

Abstract

This paper presents a method for differential magnetic force microscope imaging based on a two-pass scanning procedure to extract differential magnetic forces and eliminate or significantly reduce background forces with reversed tip magnetization. In the work, the difference of two scanned images with reversed tip magnetization was used to express the local magnetic forces. The magnetic sample was first scanned with a low lift distance between the MFM tip and the sample surface, and the magnetization direction of the probe was then changed after the first scan to perform the second scan. The differential magnetic force image was obtained through the subtraction of the two images from the two scans. The theoretical and experimental results have shown that the proposed method for differential magnetic force microscope imaging is able to reduce the effect of background or environment interference forces, and offers an improved image contrast and signal to noise ratio (SNR). SCANNING 37:112-115, 2015.

Publication Information

Output type

Research Output: Contribution to journal Article Peer-review

Original language

English

Pages from-to (Number of pages)

Pages 112-115

Journal (Volume, Issue Number)

Scanning (Volume 37, Issue 2)

Publication milestones

  • Published - 04/02/2015

Publication status

Published - 04/02/2015

ISSN

0161-0457

External Publication IDs

  • handle.net: 10547/624476
  • Scopus: 84926991466

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