TY - GEN
T1 - The effect of measurement parameters on cellular mechanics detection
AU - Wang, Rui
AU - Yang, Fan
AU - Wang, Zuobin
AU - Li, Dayou
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024/12/3
Y1 - 2024/12/3
N2 - Atomic force microscopy (AFM) is an advanced nanotechnology that can image and measure the mechanical properties of living cells in liquid environment. However, the measurement parameters will affect the mechanics data. In this work, the effects of indentation force, indentation speed, lifting height, and probe shape on the cellular mechanics detection were studied. The results showed that the indentation depth increased alongside the indentation force, while the baseline separation distance also showed an increase corresponding to the higher indentation speed, and the lifting height and cantilever shape had a significant effect on the force curves measurements. This is important for studying the measurement of cellular mechanical properties at the nanoscale.
AB - Atomic force microscopy (AFM) is an advanced nanotechnology that can image and measure the mechanical properties of living cells in liquid environment. However, the measurement parameters will affect the mechanics data. In this work, the effects of indentation force, indentation speed, lifting height, and probe shape on the cellular mechanics detection were studied. The results showed that the indentation depth increased alongside the indentation force, while the baseline separation distance also showed an increase corresponding to the higher indentation speed, and the lifting height and cantilever shape had a significant effect on the force curves measurements. This is important for studying the measurement of cellular mechanical properties at the nanoscale.
KW - atomic force microscopy
KW - cellular mechanical properties
KW - measurement parameter
KW - mechanical curve
UR - https://www.scopus.com/pages/publications/85214431894
U2 - 10.1109/3m-nano61605.2024.10769619
DO - 10.1109/3m-nano61605.2024.10769619
M3 - Conference contribution
SN - 9798350362107
T3 - 2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2024
SP - 587
EP - 591
BT - 2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2024
A2 - Wang, Ying
A2 - Cui, Yuxiao
A2 - Zhang, Jingran
A2 - Yu, Miao
A2 - Wu, Hao
A2 - Wang, Zuobin
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
Y2 - 29 July 2024 through 2 August 2024
ER -