Tapping atomic force microscopy imaging at phase resonance

Baishun Sun; Chenchen Xie; Kaige Qu; Liang Cao; Jin Yan; Ying Wang; Liguo Tian; Wenxiao Zhang; Zuobin Wang

doi:10.1109/3M-NANO49087.2021.9599767

Tapping atomic force microscopy imaging at phase resonance

Baishun Sun
, Chenchen Xie
, Kaige Qu
, Liang Cao
, Jin Yan
, Ying Wang
, Liguo Tian
, Wenxiao Zhang
, Zuobin Wang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

1 Downloads (Pure)

Abstract

Tapping atomic force microscope (TM-AFM) can measure soft samples, which has the advantages of low loss and high resolution, and has been widely used in the characterization of soft micro-nano materials by atomic force microscope (AFM). The phase image in TM-AFM contains sample properties, and it is an important method to characterize the sample by TM-AFM. At present, researchers usually select the frequency near the first resonance peak of the probe to drive its vibration to carry out scanning imaging. However, the phase sensitivity near the first-order resonance of the probe is not high. Therefore, the phase image of TM-AFM is also less sensitive to characterize micro-nano materials. In order to improve the phase sensitivity of the probe, the probe working at the phase resonance peak was selected in this paper to improve the phase sensitivity of the probe vibration and the imaging quality of TM-AFM phase image. The experimental results show that the phase image of phase resonance-atomic force microscope (PR-AFM) can provide not only the surface information but also the structure information of the sample subsurface. PR-AFM can be applied for better characterization of micro and nano materials.

Original language	English
Title of host publication	2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	47-50
Number of pages	4
ISBN (Electronic)	9781665448819
ISBN (Print)	9781665448826
DOIs	https://doi.org/10.1109/3M-NANO49087.2021.9599767
Publication status	Published - 17 Nov 2021
Event	2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Xi'an, China Duration: 2 Aug 2021 → 6 Aug 2021 http://3m-nano.org/2021/main/index.asp

Publication series

Name	2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings

Conference

Conference	2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
City	Xi'an, China
Period	2/08/21 → 6/08/21
Other	2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) (02/08/2021-06/08/2021, Xi'an, China)
Internet address	http://3m-nano.org/2021/main/index.asp

Keywords

PR-AFM
TM-AFM phase image
atomic force acoustic microscopy
first-order resonance
imaging quality
phase resonance peak
phase resonance-atomic force microscope
phase sensitivity
probe vibration
sample properties
scanning imaging
soft micronanomaterials
soft samples
Phase image
Soft sample
TM-AFM

ASJC Scopus subject areas

Industrial and Manufacturing Engineering
Electronic, Optical and Magnetic Materials
Metals and Alloys
Polymers and Plastics
Surfaces, Coatings and Films
Control and Optimization
Instrumentation

Access to Document

10.1109/3M-NANO49087.2021.9599767

14-Tapping atomic force microscopy imaging at phase resonanceAccepted author manuscript, 739 KBLicence: CC BY-NC-ND

https://ieeexplore.ieee.org/document/9599767

Handle.net

Persistent link

Cite this

Sun, B., Xie, C., Qu, K., Cao, L., Yan, J., Wang, Y., Tian, L., Zhang, W., & Wang, Z. (2021). Tapping atomic force microscopy imaging at phase resonance. In 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings (pp. 47-50). (2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/3M-NANO49087.2021.9599767

Sun, Baishun ; Xie, Chenchen ; Qu, Kaige et al. / Tapping atomic force microscopy imaging at phase resonance. 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. pp. 47-50 (2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings).

@inproceedings{70e3c62f0a9342ffa0e3e05f187b4ec8,

title = "Tapping atomic force microscopy imaging at phase resonance",

abstract = "Tapping atomic force microscope (TM-AFM) can measure soft samples, which has the advantages of low loss and high resolution, and has been widely used in the characterization of soft micro-nano materials by atomic force microscope (AFM). The phase image in TM-AFM contains sample properties, and it is an important method to characterize the sample by TM-AFM. At present, researchers usually select the frequency near the first resonance peak of the probe to drive its vibration to carry out scanning imaging. However, the phase sensitivity near the first-order resonance of the probe is not high. Therefore, the phase image of TM-AFM is also less sensitive to characterize micro-nano materials. In order to improve the phase sensitivity of the probe, the probe working at the phase resonance peak was selected in this paper to improve the phase sensitivity of the probe vibration and the imaging quality of TM-AFM phase image. The experimental results show that the phase image of phase resonance-atomic force microscope (PR-AFM) can provide not only the surface information but also the structure information of the sample subsurface. PR-AFM can be applied for better characterization of micro and nano materials.",

keywords = "PR-AFM, TM-AFM phase image, atomic force acoustic microscopy, first-order resonance, imaging quality, phase resonance peak, phase resonance-atomic force microscope, phase sensitivity, probe vibration, sample properties, scanning imaging, soft micronanomaterials, soft samples, Phase image, Soft sample, TM-AFM",

author = "Baishun Sun and Chenchen Xie and Kaige Qu and Liang Cao and Jin Yan and Ying Wang and Liguo Tian and Wenxiao Zhang and Zuobin Wang",

note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) ; Conference date: 02-08-2021 Through 06-08-2021",

year = "2021",

month = nov,

day = "17",

doi = "10.1109/3M-NANO49087.2021.9599767",

language = "English",

isbn = "9781665448826",

series = "2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "47--50",

booktitle = "2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings",

address = "United States",

url = "http://3m-nano.org/2021/main/index.asp",

}

Sun, B, Xie, C, Qu, K, Cao, L, Yan, J, Wang, Y, Tian, L, Zhang, W & Wang, Z 2021, Tapping atomic force microscopy imaging at phase resonance. in 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings. 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 47-50, 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Xi'an, China, 2/08/21. https://doi.org/10.1109/3M-NANO49087.2021.9599767

Tapping atomic force microscopy imaging at phase resonance. / Sun, Baishun; Xie, Chenchen; Qu, Kaige et al.
2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. p. 47-50 (2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Tapping atomic force microscopy imaging at phase resonance

AU - Sun, Baishun

AU - Xie, Chenchen

AU - Qu, Kaige

AU - Cao, Liang

AU - Yan, Jin

AU - Wang, Ying

AU - Tian, Liguo

AU - Zhang, Wenxiao

AU - Wang, Zuobin

PY - 2021/11/17

Y1 - 2021/11/17

N2 - Tapping atomic force microscope (TM-AFM) can measure soft samples, which has the advantages of low loss and high resolution, and has been widely used in the characterization of soft micro-nano materials by atomic force microscope (AFM). The phase image in TM-AFM contains sample properties, and it is an important method to characterize the sample by TM-AFM. At present, researchers usually select the frequency near the first resonance peak of the probe to drive its vibration to carry out scanning imaging. However, the phase sensitivity near the first-order resonance of the probe is not high. Therefore, the phase image of TM-AFM is also less sensitive to characterize micro-nano materials. In order to improve the phase sensitivity of the probe, the probe working at the phase resonance peak was selected in this paper to improve the phase sensitivity of the probe vibration and the imaging quality of TM-AFM phase image. The experimental results show that the phase image of phase resonance-atomic force microscope (PR-AFM) can provide not only the surface information but also the structure information of the sample subsurface. PR-AFM can be applied for better characterization of micro and nano materials.

AB - Tapping atomic force microscope (TM-AFM) can measure soft samples, which has the advantages of low loss and high resolution, and has been widely used in the characterization of soft micro-nano materials by atomic force microscope (AFM). The phase image in TM-AFM contains sample properties, and it is an important method to characterize the sample by TM-AFM. At present, researchers usually select the frequency near the first resonance peak of the probe to drive its vibration to carry out scanning imaging. However, the phase sensitivity near the first-order resonance of the probe is not high. Therefore, the phase image of TM-AFM is also less sensitive to characterize micro-nano materials. In order to improve the phase sensitivity of the probe, the probe working at the phase resonance peak was selected in this paper to improve the phase sensitivity of the probe vibration and the imaging quality of TM-AFM phase image. The experimental results show that the phase image of phase resonance-atomic force microscope (PR-AFM) can provide not only the surface information but also the structure information of the sample subsurface. PR-AFM can be applied for better characterization of micro and nano materials.

KW - PR-AFM

KW - TM-AFM phase image

KW - atomic force acoustic microscopy

KW - first-order resonance

KW - imaging quality

KW - phase resonance peak

KW - phase resonance-atomic force microscope

KW - phase sensitivity

KW - probe vibration

KW - sample properties

KW - scanning imaging

KW - soft micronanomaterials

KW - soft samples

KW - Phase image

KW - Soft sample

KW - TM-AFM

UR - https://www.scopus.com/pages/publications/85123271995

U2 - 10.1109/3M-NANO49087.2021.9599767

DO - 10.1109/3M-NANO49087.2021.9599767

M3 - Conference contribution

SN - 9781665448826

T3 - 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings

SP - 47

EP - 50

BT - 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

Y2 - 2 August 2021 through 6 August 2021

ER -

Sun B, Xie C, Qu K, Cao L, Yan J, Wang Y et al. Tapping atomic force microscopy imaging at phase resonance. In 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2021. p. 47-50. (2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2021 - Proceedings). doi: 10.1109/3M-NANO49087.2021.9599767

Tapping atomic force microscopy imaging at phase resonance

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

Handle.net

Other files and links

Fingerprint

Cite this