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Swarm robot SLAM with point-line matching in weak information environments

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Simultaneous Localization and Mapping (SLAM) in weak information environment scenarios where there are only sparse and ambiguous references are available presents significant challenges. This paper introduces a swarm robots based point-line matching based solution to enhance the accuracy and robustness of localization and mapping within such environments. Our approach employs a centralized serverbased architecture for the swarm robot system and utilizes an ORB-based Distributed Bag-of-Words (DBoW) algorithm to construct point and line feature dictionaries. By generating point-line pairs, the proposed method effectively addresses perceptual overlap issues, thereby improving the overall performance of localization and mapping for swarm robots. Experimental results validate the superiority of the proposed approach in comparison to traditional methods, highlighting its potential for real-world applications in challenging environments for swarm robot SLAM.
Original languageEnglish
Title of host publication2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2023 - Proceedings
EditorsZuobin Wang, Dongxu Wang
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages85-90
Number of pages6
ISBN (Electronic)9798350344486
ISBN (Print)9798350344486
DOIs
Publication statusPublished - 7 Nov 2023
Event2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Chengdu
Duration: 31 Jul 20234 Aug 2023

Publication series

Name2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2023 - Proceedings

Conference

Conference2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
CityChengdu
Period31/07/234/08/23
Other2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) (31/07/2023-04/08/2023, Chengdu)

Keywords

  • Point-Line Matching
  • SLAM
  • Swarm Robot
  • Weak Information Environment

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Spectroscopy
  • Mechanical Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Instrumentation

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