Subcarrier fading in UWB OFDM symbols

Vit Sipal; David J. Edwards; Ben Allen

doi:10.1109/APS.2012.6348006

Subcarrier fading in UWB OFDM symbols

Vit Sipal
, David J. Edwards
, Ben Allen

University of Bedfordshire

University of Oxford

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper studies the correlation between subcarriers in ultrawideband OFDM symbols. It is shown that because the channel impulse response can be assumed identical for all subcarriers within the OFDM symbol, the correlation remains strong throughout the symbol. This can be used to determine the probability distribution function of subcarrier fading within the OFDM symbol. These statistics are used for more accurate Bit-Error-Rate (BER) estimation than the standard approach using the assumption of independent BER for each subcarrier.

Original language	English
Title of host publication	nan
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781467304627
ISBN (Print)	9781467304610
DOIs	https://doi.org/10.1109/APS.2012.6348006
Publication status	Published - 10 Nov 2012
Event	Proceedings of the 2012 IEEE International Symposium on Antennas and Propagation - Chicago Duration: 8 Jul 2012 → 14 Jul 2012

Conference

Conference	Proceedings of the 2012 IEEE International Symposium on Antennas and Propagation
City	Chicago
Period	8/07/12 → 14/07/12
Other	Proceedings of the 2012 IEEE International Symposium on Antennas and Propagation (08/07/2012-14/07/2012, Chicago)

Keywords

OFDMA

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10.1109/APS.2012.6348006

https://ieeexplore.ieee.org/document/6348006

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title = "Subcarrier fading in UWB OFDM symbols",

abstract = "This paper studies the correlation between subcarriers in ultrawideband OFDM symbols. It is shown that because the channel impulse response can be assumed identical for all subcarriers within the OFDM symbol, the correlation remains strong throughout the symbol. This can be used to determine the probability distribution function of subcarrier fading within the OFDM symbol. These statistics are used for more accurate Bit-Error-Rate (BER) estimation than the standard approach using the assumption of independent BER for each subcarrier.",

keywords = "OFDMA",

author = "Vit Sipal and Edwards, \{David J.\} and Ben Allen",

year = "2012",

month = nov,

day = "10",

doi = "10.1109/APS.2012.6348006",

language = "English",

isbn = "9781467304610",

booktitle = "nan",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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note = "Proceedings of the 2012 IEEE International Symposium on Antennas and Propagation ; Conference date: 08-07-2012 Through 14-07-2012",

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TY - GEN

T1 - Subcarrier fading in UWB OFDM symbols

AU - Sipal, Vit

AU - Edwards, David J.

AU - Allen, Ben

PY - 2012/11/10

Y1 - 2012/11/10

N2 - This paper studies the correlation between subcarriers in ultrawideband OFDM symbols. It is shown that because the channel impulse response can be assumed identical for all subcarriers within the OFDM symbol, the correlation remains strong throughout the symbol. This can be used to determine the probability distribution function of subcarrier fading within the OFDM symbol. These statistics are used for more accurate Bit-Error-Rate (BER) estimation than the standard approach using the assumption of independent BER for each subcarrier.

AB - This paper studies the correlation between subcarriers in ultrawideband OFDM symbols. It is shown that because the channel impulse response can be assumed identical for all subcarriers within the OFDM symbol, the correlation remains strong throughout the symbol. This can be used to determine the probability distribution function of subcarrier fading within the OFDM symbol. These statistics are used for more accurate Bit-Error-Rate (BER) estimation than the standard approach using the assumption of independent BER for each subcarrier.

KW - OFDMA

U2 - 10.1109/APS.2012.6348006

DO - 10.1109/APS.2012.6348006

M3 - Conference contribution

SN - 9781467304610

BT - nan

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - Proceedings of the 2012 IEEE International Symposium on Antennas and Propagation

Y2 - 8 July 2012 through 14 July 2012

ER -

Subcarrier fading in UWB OFDM symbols

Abstract

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Keywords

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