@inproceedings{1051862d499b4711abe29936281e360d,
title = "Research on the performance of PGC phase demodulation algorithm based on WTD-ESO",
abstract = "Phase generated carrier (PGC) technology is a commonly used signal demodulation scheme. PGC demodulation is easily affected by light source intensity fluctuation, system noise and environmental disturbance. In order to improve the accuracy and robustness of PGC phase demodulation, a PGC phase demodulation algorithm combining wavelet threshold de-noising (WTD) and extended state observer (ESO) is proposed in this paper. WTD is used to preprocess the PGC interference signal with noise to effectively suppress the noise interference. A phase tracker based on ESO is constructed to estimate the phase to be demodulated, the phase change rate and the lumped disturbance in the system as the extended state, so as to achieve the accurate extraction of the phase. This algorithm can significantly improve the accuracy and dynamic response characteristics of PGC phase demodulation in complex noise environment.",
keywords = "extented state observer, phase generated carrier, wavelet threshold denoising",
author = "Jiaqi Xi and Li Li and Zuobin Wang and Fujun Wang and Dayou Li",
note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 2025 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2025 ; Conference date: 28-07-2025 Through 01-08-2025",
year = "2025",
month = dec,
day = "2",
doi = "10.1109/3M-NANO65639.2025.11261014",
language = "English",
isbn = "9798331543686",
series = "2025 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2025 - Conference Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "588--592",
editor = "Miao Yu and Yi Zeng and Bowei Wang and Junxi Wang and Hao Wu and Dongxu Wang and Zhengxun Song and Zuobin Wang",
booktitle = "2025 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2025 - Conference Proceedings",
address = "United States",
}