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PGC-Arctan demodulation method based on improved IKEF

  • Hao Li
  • , Li Li
  • , Kuo Sun
  • , Yanling Tian
  • , Dayou Li
  • , Zuobin Wang
  • , Hongmei Xu
  • , Lu Wang
  • Changchun University of Science and Technology
  • University of Warwick

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

The proposed method is an improvement on the traditional PGC demodulation technique, specifically addressing the impact of carrier phase delay, modulation depth drift, and low-frequency ambient noise on phase demodulation accuracy in phase-modulated homodyne interferometers. It utilises an improved iterative extended Kalman filtering (IEKF) approach. The algorithm enhances the iterative updating process by incorporating a damping factor into the traditional IEKF. This enables optimal estimation and correction of the parameters of the PGC quadrature signals, resulting in reduced nonlinear error in the demodulation process. Additionally, the improved algorithm achieves higher demodulation accuracy. Simulation results demonstrate the method's effectiveness in eliminating nonlinear error in phase generation carrier.
Original languageEnglish
Title of host publication2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2024
EditorsYing Wang, Yuxiao Cui, Jingran Zhang, Miao Yu, Hao Wu, Zuobin Wang
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages618-622
Number of pages5
ISBN (Electronic)9798350362107
ISBN (Print)9798350362107
DOIs
Publication statusPublished - 3 Dec 2024
Event2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Zhongshan
Duration: 29 Jul 20242 Aug 2024

Publication series

Name2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2024

Conference

Conference2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
CityZhongshan
Period29/07/242/08/24
Other2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) (29/07/2024-02/08/2024, Zhongshan)

Keywords

  • iterative extended Kalman filtering
  • nonlinear error
  • phase generation carrier

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Biotechnology
  • Electrical and Electronic Engineering

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