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An enhanced YOLOv8 framework for MRI brain tumor detection: Integrating dense connectivity and dynamic attention mechanisms

  • Ziyi Wang
  • , Li Li
  • , Zuobin Wang
  • , Fujun Wang
  • , Dayou Li
  • , Lu Wang
  • , Miao Yu
  • Changchun University of Science and Technology
  • Tianjin University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper explores core obstacles in the application of object detection models to medical imaging, focusing on issues stemming from scale variation and fuzzy boundaries in MRI brain tumor analysis. We propose an improved detection framework that integrates a lightweight efficient backbone with a high-resolution detection strategy. Research centers on two core directions: optimizing internal feature extraction via dense connectivity and dynamic convolution, and enhancing cross-scale information fusion. Based on the You Only Look Once version 8 (YOLOv8) architecture, we develop a paradigm that replaces the standard C2f module with a fused CSP-DenseNet and KernelWarehouse structure. Subsequently, we introduce a Generalized Feature Pyramid Network (GFPN) embedded with Bi-directional Routing Attention (BRA) to capture long-range dependencies. Furthermore, the framework expands the detection logic to include a fourth highresolution head specifically for micro-tumor identification. Empirical validation on brain tumor datasets demonstrates significant improvements over existing baselines. Major breakthroughs are achieved in small object recall and mean Average Precision (mAP), with the proposed model achieving a 4.7% increase in [email protected] and an 11.2% improvement in micro-lesion recall while maintaining real-time performance. Consequently, this research offers a novel perspective for clinical early diagnosis systems.
Original languageEnglish
Title of host publicationInternational Conference on Pattern Recognition and Image Analysis, PRIA 2025
Subtitle of host publicationSPIE Digital Library
EditorsJixin Ma, Philippe Fournier-Viger, Qian Zheng, Deepak Kumar Jain
PublisherSPIE
Volume14172
ISBN (Electronic)9798902323983
DOIs
Publication statusPublished - 15 Apr 2026
Event2025 International Conference on Pattern Recognition and Image Analysis, PRIA 2025 - Zhengzhou, China
Duration: 26 Dec 202528 Dec 2025

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume14172
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2025 International Conference on Pattern Recognition and Image Analysis, PRIA 2025
Country/TerritoryChina
CityZhengzhou
Period26/12/2528/12/25

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